Lightweight, error-tolerant edge detection using memristor-enabled stochastic logics

PubDate: Mar 2024

Teams: The Chinese University of Hong Kong;Nanyang Technological University;University of Cambridge

Writers: Lekai Song, Pengyu Liu, Jingfang Pei, Yang Liu, Songwei Liu, Shengbo Wang, Leonard W. T. Ng, Tawfique Hasan, Kong-Pang Pun, Shuo Gao, Guohua Hu

PDF: Lightweight, error-tolerant edge detection using memristor-enabled stochastic logics

Abstract

The demand for efficient edge vision has spurred the interest in developing stochastic computing approaches for performing image processing tasks. Memristors with inherent stochasticity readily introduce probability into the computations and thus enable stochastic image processing computations. Here, we present a stochastic computing approach for edge detection, a fundamental image processing technique, facilitated with memristor-enabled stochastic logics. Specifically, we integrate the memristors with logic circuits and harness the stochasticity from the memristors to realize compact stochastic logics for stochastic number encoding and processing. The stochastic numbers, exhibiting well-regulated probabilities and correlations, can be processed to perform logic operations with statistical probabilities. This can facilitate lightweight stochastic edge detection for edge visual scenarios characterized with high-level noise errors. As a practical demonstration, we implement a hardware stochastic Roberts cross operator using the stochastic logics, and prove its exceptional edge detection performance, remarkably, with 95% less computational cost while withstanding 50% bit-flip errors. The results underscore the great potential of our stochastic edge detection approach in developing lightweight, error-tolerant edge vision hardware and systems for autonomous driving, virtual/augmented reality, medical imaging diagnosis, industrial automation, and beyond.